index of X
= I =
infant mortality n.
It is common lore among hackers (and in
the electronics industry at large; this term is possibly techspeak
by now) that the chances of sudden hardware failure drop off
exponentially with a machine's time since first use (that is, until
the relatively distant time at which enough mechanical wear in I/O
devices and thermal-cycling stress in components has accumulated
for the machine to start going senile). Up to half of all chip and
wire failures happen within a new system's first few weeks; such
failures are often referred to as `infant mortality' problems
(or, occasionally, as `sudden infant death syndrome'). See
bathtub curve, burn-in period, Infant Mortality as applied to Engineering Systems.
--The Jargon File version 4.3.1, ed. ESR, autonoded by rescdsk.